 | |||||||||||
| |||||||||||
| |||||||||||
| |||||||||||
| ||||
 | NanoScan Near-field profiling is a common technique used to analyze small laser beams and other sources such as laser diodes, VCSELs, optical fiber, and/or waveguides. Photon has several near-f ... Read more ... NanoScan Near-field profiling is a common technique used to analyze small laser beams and other sources such as laser diodes, VCSELs, optical fiber, and/or waveguides. Photon has several near-field profiling instrument to fit a variety of applications. Near-Field Profilers (NFPs) covering a wide range of wavelengths:
NFP-980: specifically designed for measurement of 980 nm pump lasers. NFP-1550: is designed for use in characterizing sources in the 1300nm-1600nm telecommunications wave-length band. NFP-VIS: for visible wavelengths, for the 400-700nm wavelength range. NFP-Pyro: For higher power and longer wavelength beams for wavelength from 190nm to 20μm is available. Can measure beam powers up to 100W.  
Photon Inc NanoScan Near Field Profiler | | ||
| ||||
 | NanoScan Near field profiling is used to analyze small beams, and involves a microscope objective lens to image the beam onto a camera detector array. Read more ... NanoScan Near field profiling is used to analyze small beams, and involves a microscope objective lens to image the beam onto a camera detector array. This technique expands the measurement range of the camera to include smaller beams, which could not be ordinarily measured due to the pixel size of the detector array. systems include the camera, ATP-SM continuously variable attenuator, bracket and 60X magnification microscope objective lens, with broadband AR coating. Model NFP-2323:
 Optional accessories include:
Photon Inc NanoScan Camera Based Near Field Profiler | | ||
Photonics 
