SL-Sys™ neo for precision miniature optic testing. SL-Sys neo enables to characterize small optical components (diameter up to 12mm). It will measure the wavefront, the focal length, the chromaticism @ 532/630nm, the MTF @ 532nm, the relative illumination, the curvature.

Fully automated wavefront characterization of high NA miniature optics from 1-12mm.

• Precision wavefront characterization
• BFL, EFL, chromatism, field curvature, distortion, vignetting, relative illumination
• 3D and through-focus MTF